Company Filing History:
Years Active: 1998-1999
Title: Maria Noack: Innovator in Integrated Circuit Testing
Introduction
Maria Noack is a prominent inventor based in Austin, TX, known for her contributions to the field of integrated circuit testing. With a total of 2 patents, she has made significant advancements that enhance the efficiency and effectiveness of testing integrated circuit chips.
Latest Patents
One of her latest patents is titled "Scan-bypass architecture without additional external latches." This innovative scan architecture is designed for testing integrated circuit chips that contain scannable memory devices, such as register arrays. The architecture operates in a bypass mode, allowing only a small portion of the memory cells in each device or array to be inserted into the scan path. This approach substantially reduces scan path length, test time, and test data volume during the testing of other logic components in the circuit chip. Additional decoder logic is employed to select a limited number of words in the device or array during the scan-bypass mode, while multiplexor circuitry effectively removes the bypassed words from the scan path. By retaining a small number of register array words in the scan path, the observability of logic upstream and controllability of logic downstream of the array are preserved during the bypass mode, eliminating the need for additional shift register latches and other external logic components.
Career Highlights
Maria Noack is currently associated with International Business Machines Corporation (IBM), where she continues to innovate and contribute to the field of technology. Her work has been instrumental in advancing the capabilities of integrated circuit testing.
Collaborations
Throughout her career, Maria has collaborated with notable colleagues, including Pamela Sue Gillis and Ravi Kumar Kolagotla. These collaborations have further enriched her work and contributed to the development of innovative solutions in her field.
Conclusion
Maria Noack stands out as a significant figure in the realm of integrated circuit testing, with her innovative patents and contributions to the industry. Her work not only enhances testing efficiency but also paves the way for future advancements in technology.