Company Filing History:
Years Active: 2024
Title: Maria Isabel Jimenez-Lopez: Innovator in Coating Thickness Measurement
Introduction
Maria Isabel Jimenez-Lopez is a notable inventor based in Derby, GB. She has made significant contributions to the field of measurement technology, particularly with her innovative patent related to coating thickness measurement instruments. Her work exemplifies the intersection of engineering and practical application in industrial settings.
Latest Patents
Maria Isabel Jimenez-Lopez holds a patent for a coating thickness measuring instrument. This instrument comprises a magnetic induction probe with at least one drive coil and one pick-up coil. It includes a driver that drives an alternating current in the drive coil and a detector that detects the output of the pick-up coil. The processor is configured to apply a transfer function to the detector output, producing an output that corresponds to the measured coating thickness. The instrument allows for simultaneous scaling of both the drive current and detector output, which can be adjusted in a step-wise manner. This innovative approach enhances the accuracy and efficiency of coating thickness measurements.
Career Highlights
Maria has established herself as a key figure in her field through her work at Elcometer, Inc. Her dedication to innovation and quality has contributed to the advancement of measurement technologies. With her expertise, she has played a vital role in developing tools that are essential for various industrial applications.
Collaborations
Maria has collaborated with notable colleagues, including Philip Anthony May and Simon Trevena Coulton. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.
Conclusion
Maria Isabel Jimenez-Lopez is a pioneering inventor whose work in coating thickness measurement instruments has made a significant impact in the industry. Her innovative spirit and collaborative efforts continue to drive advancements in measurement technology.