Eindhoven, Netherlands

Marc T Looijer


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: **Innovations by Marc T. Looijer: A Pioneer in Transfer Characteristics Testing**

Introduction

Marc T. Looijer, based in Eindhoven, Netherlands, is an accomplished inventor known for his contributions to the field of electronics testing. With a patent to his name, Looijer's innovative approaches have garnered attention within the industry, particularly in improving the accuracy of measurements related to device performance.

Latest Patents

Looijer's notable patent is titled "Method and apparatus for obtaining transfer characteristics of a device." The invention focuses on a time domain method for retrieving the transfer characteristics of a Device Under Test (DUT). By applying both sine and cosine sweeps to the input of the DUT and measuring the response signals at its output, Looijer's method establishes a complex input signal, linking specific frequencies to individual time instances. This dual approach allows for precise calculation of magnitudes and phases, with the transfer characteristics derived from the ratio of the input signal and response signal's phase differences.

Career Highlights

Throughout his professional journey, Marc T. Looijer has been contributing to the advancements in the electronics sector while working for the reputable company, U.S. Philips Corporation. Looijer's expertise in the field has paved the way for significant improvements in testing methodologies, enhancing the reliability of device performance evaluations.

Collaborations

Looijer has collaborated with notable peers, including Taco Zwemstra and Gerardus P. Seuren. Their collective efforts in research and development have further enriched the innovative environment at U.S. Philips Corporation, fostering groundbreaking advancements and refining existing technologies.

Conclusion

Marc T. Looijer stands out as a key figure in the realm of electronics testing. His patent demonstrates a forward-thinking approach to device assessment, positioning him as a valuable contributor to the industry. With ongoing collaborations and a commitment to innovation, Looijer's work continues to inspire advancements in technology and engineering.

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