Phoenix, AZ, United States of America

Mamoru Yamayoshi

USPTO Granted Patents = 1 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: **Inventor Mamoru Yamayoshi: Revolutionizing Endpoint Detection in Semiconductor Technology**

Introduction

Mamoru Yamayoshi, based in Phoenix, AZ, is an innovative inventor making significant strides in the field of semiconductor technology. With a focus on improving endpoint detection systems, Yamayoshi has contributed to enhancing the efficiency and accuracy of semiconductor wafer planarization processes.

Latest Patents

Yamayoshi holds a patent for a groundbreaking innovation titled "Flexible Snapshot in Endpoint Detection." This system and method enable precise determination of endpoint detection during semiconductor wafer planarization. The invention addresses baseline variability induced errors often faced in endpoint detection, providing a flexible solution. By employing an endpoint detection signal to monitor the optical characteristics of the wafer, the system continues to analyze the detection signal until the established endpoint criterion is met. When this criterion is achieved, a new snapshot is captured, updating the baseline for accurate endpoint detection.

Career Highlights

Currently, Mamoru Yamayoshi is associated with Novellus Systems Incorporated, a company renowned for its advanced technology in semiconductor manufacturing. His work is pivotal in developing systems that ensure reliable endpoint detection, a critical aspect of the planarization process in semiconductor production.

Collaborations

Throughout his career, Yamayoshi has collaborated with notable professionals in the field, including Thomas Laursen. This partnership has fostered innovation and contributed to the overall advancement of semiconductor technologies.

Conclusion

Mamoru Yamayoshi's contributions to semiconductor technology, specifically through his innovative patent for flexible endpoint detection, highlight his role as a significant inventor in the industry. His work not only enhances the efficiency of semiconductor manufacturing processes but also lays the groundwork for future advancements in the field.

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