Lun Z Chen

Title: Lun Z Chen - Innovator in Airborne Radar Technology

Introduction

Lun Z Chen is a notable inventor based in Brooklyn, NY (US). She has made significant contributions to the field of airborne radar systems. Her innovative approach has led to the development of a unique patent that enhances the detection of slow-moving ground targets.

Latest Patents

Lun Z Chen holds a patent for the "Angle-Doppler Keystone formatting for airborne look-down radar system." This invention introduces a method for detecting slow-moving ground targets by utilizing angle and Doppler information through a Keystone formatting process. The Angle-Doppler Keystone Formatting (ADK) technique effectively collapses the clutter ridge to a constant Doppler or angle, transforming the clutter ridge in angle-Doppler space into a horizontal line of constant Doppler or a vertical line of constant angle. This innovation allows for more effective filtering of clutter, utilizing multiple beams as sources of STAP training data or employing multiple Doppler bins.

Career Highlights

Lun Z Chen has established herself as a key figure in the radar technology sector. Her work at Src Corporation has been instrumental in advancing airborne radar systems. With her expertise, she has contributed to the development of technologies that improve target detection capabilities.

Collaborations

Lun has collaborated with notable colleagues, including Harvey K Schuman and Daniel D Thomas, Jr. These partnerships have fostered innovation and have been crucial in the successful implementation of her patented technology.

Conclusion

Lun Z Chen's contributions to airborne radar technology exemplify her innovative spirit and dedication to advancing the field. Her patent on Angle-Doppler Keystone Formatting showcases her ability to solve complex problems in radar signal interpretation. Through her work, she continues to influence the future of airborne radar systems.