Seattle, WA, United States of America

Lukasz Ambrozinski


Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Innovations of Lukasz Ambrozinski in Acoustic Wave Measurement

Introduction

Lukasz Ambrozinski is an accomplished inventor based in Seattle, WA. He has made significant contributions to the field of acoustic wave measurement, particularly in the development of methods for analyzing soft materials. His innovative approach utilizes air-coupled ultrasound technology to generate mechanical waves, which can be used to measure various properties of materials.

Latest Patents

Lukasz holds a patent titled "Non-contact acoustic radiation force based (ARF-based) generation of broad bandwidth mechanical waves using air-coupled ultrasound." This patent describes methods and systems for measuring one or more properties of a soft material by employing air-transmitted ultrasound that reflects off the material. The process involves transmitting ultrasound through air to an interface boundary between the soft material and air. The ultrasound is reflected from the soft material, generating a mechanical wave within it. The propagation of this mechanical wave is then measured using an imaging system, allowing for the determination of the soft material's properties based on the measured wave propagation. He has 1 patent to his name.

Career Highlights

Lukasz Ambrozinski is affiliated with the University of Washington, where he continues to advance research in his field. His work has garnered attention for its innovative use of ultrasound technology in material science.

Collaborations

Lukasz has collaborated with notable colleagues, including Matthew N O'Donnell and Ivan Pelivanov, who share his passion for advancing acoustic measurement techniques.

Conclusion

Lukasz Ambrozinski's contributions to the field of acoustic wave measurement demonstrate his innovative spirit and commitment to advancing technology. His work at the University of Washington and his patented methods are paving the way for new applications in material analysis.

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