Company Filing History:
Years Active: 1995
Title: The Innovations of Luis M. Casas
Introduction
Luis M. Casas is an accomplished inventor based in Jersey City, NJ. He has made significant contributions to the field of measurement technology, particularly in the area of thin film thickness measurement. His innovative approach has garnered attention within the scientific community.
Latest Patents
One of his notable patents is a method for measuring thin film thickness. This method provides a simple and effective way to determine the thickness of layers as thin as 1-2 nm. Although the method is destructive, it consumes very little material, making it a valuable tool in various applications. Luis holds 1 patent for this invention.
Career Highlights
Luis M. Casas works for the U.S. Government as represented by the Secretary of the Army. His role involves applying his expertise in measurement techniques to support various military and research initiatives. His work has been instrumental in advancing the understanding of material properties.
Collaborations
Luis has collaborated with notable colleagues, including Donald W. Eckart and Richard T. Lareau. These partnerships have allowed him to enhance his research and contribute to innovative solutions in his field.
Conclusion
Luis M. Casas exemplifies the spirit of innovation through his work in measurement technology. His contributions, particularly in thin film thickness measurement, highlight the importance of precision in scientific research and applications.
Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.