Londonderry, NH, United States of America

Louis W Perich



 

Average Co-Inventor Count = 4.6

ph-index = 3

Forward Citations = 331(Granted Patents)


Company Filing History:


Years Active: 2006-2009

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3 patents (USPTO):Explore Patents

Title: Innovations of Louis W. Perich in X-ray Backscatter Technology

Introduction

Louis W. Perich is an accomplished inventor based in Londonderry, NH (US). He has made significant contributions to the field of inspection systems, particularly through his innovative work in X-ray backscatter technology. With a total of 3 patents, Perich has developed systems that enhance the safety and efficiency of inspections in various environments.

Latest Patents

One of his latest patents is the "X-ray backscatter detection imaging modules." This inspection system is characterized by an imaging enclosure that includes a source of penetrating radiation and a spatial modulator. These components are concealed within the body of an enclosure, such as a shipping container, allowing for convenient operational deployment. The system forms images based on scatter signals and relative motion signals, providing detailed insights into the contents of the inspected object.

Another notable patent is the "X-ray backscatter mobile inspection van." This system utilizes an enclosed conveyance, such as a van, designed for road travel to inspect persons or objects. Similar to his previous invention, it features a source of penetrating radiation and a spatial modulator contained within the van's body. The system generates scatter signals and utilizes proximity sensors to create images of the inspected objects, enhancing security measures in various settings.

Career Highlights

Louis W. Perich is associated with American Science and Engineering, Inc., a company known for its advanced inspection technologies. His work has significantly impacted the field, providing innovative solutions for security and safety inspections.

Collaborations

Throughout his career, Perich has collaborated with notable colleagues, including Alex Chalmers and Peter John Rothschild. These partnerships have contributed to the development and refinement of his innovative technologies.

Conclusion

Louis W. Perich's contributions to X-ray backscatter technology exemplify his commitment to innovation in inspection systems. His patents reflect a deep understanding of safety and efficiency, making a lasting impact in the field.

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