Company Filing History:
Years Active: 2005
Title: Lisa Birgit Aberle: Innovator in Turbid Media Examination
Introduction
Lisa Birgit Aberle is a prominent inventor based in Bremen, Germany. She has made significant contributions to the field of optical examination techniques, particularly in the study of turbid media. Her innovative approach has led to the development of a unique device that enhances the accuracy of such examinations.
Latest Patents
Lisa holds a patent for a "Method and device for suppressing multiple scattering when examining turbid media by means of three-dimensional cross-correlation technique." This invention relates to a portable device designed for conducting examinations of turbid media. It utilizes a three-dimensional cross-correlation technique to suppress the influence of multiple scattering. The device features a base plate that supports an adjustable laser, which directs the laser beam perpendicularly onto the wall of a cuvette filled with the medium to be examined. Additionally, it includes a translucent plate that serves as a beam splitter, with sections that are both completely and partially mirror-coated. The device is equipped with displacement devices for continuous positioning of the cuvette fixture and detection optics, along with photon multipliers and correlators for receiving cross-correlation or auto-correlation functions.
Career Highlights
Lisa is affiliated with the Fraunhofer Gesellschaft zur Förderung der Angewandten Forschung e.V., a leading research organization in Germany. Her work at this institution has allowed her to focus on applied research and innovation in optical technologies.
Collaborations
Throughout her career, Lisa has collaborated with notable colleagues, including Wilfried Straude and Malte Kleemeier. These partnerships have contributed to the advancement of her research and the successful development of her patented technologies.
Conclusion
Lisa Birgit Aberle is a trailblazer in the field of optical examination of turbid media. Her innovative device and method have the potential to significantly improve the accuracy of examinations in various scientific and industrial applications.