Winchester, MA, United States of America

Leo A Fama


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:

goldMedal1 out of 832,891 
Other
 patents

Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Innovations of Leo A Fama in Electron Microscopy

Introduction

Leo A Fama is an accomplished inventor based in Winchester, MA (US). He has made significant contributions to the field of electron microscopy, particularly through his innovative patent that enhances the functionality of transmission electron microscopes (TEM).

Latest Patents

Fama holds a patent for a "Method and apparatus allowing simultaneous direct observation and electronic capture of scintillation images in an electron microscope." This invention allows for simultaneous direct viewing and electronic capture of images in a TEM. The traditional opaque direct viewing plate is replaced by a two-sided direct viewing plate that includes at least one scintillator. This design produces light emissions from both its upper and lower surfaces, enabling an electronic camera to be used alongside direct human viewing. The method is also compatible with traditional permanent image recording units, which are often desired in such microscopes.

Career Highlights

Throughout his career, Leo A Fama has focused on advancing the capabilities of electron microscopy. His innovative approach has led to improved imaging techniques that benefit researchers and scientists in various fields. His work has been recognized for its potential to enhance the accuracy and efficiency of electron microscopy.

Collaborations

Fama has collaborated with notable professionals in his field, including James F Mancuso. Their joint efforts have contributed to the development of advanced technologies in microscopy.

Conclusion

Leo A Fama's contributions to electron microscopy through his innovative patent demonstrate his commitment to advancing scientific research. His work continues to influence the field and improve imaging techniques for researchers worldwide.

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