Company Filing History:
1 out of 24 
1 out of 35 
1 out of 25 Years Active: 1996-2016
Title: The Innovations of Lawrence A. Dean
Introduction
Lawrence A. Dean is a prominent inventor based in Vadnais Heights, Minnesota, known for his significant contributions to the field of data storage and error simulation. With three patents to his name, Dean has demonstrated an exceptional ability to pioneer innovative systems that enhance the functionality of data storage subsystems.
Latest Patents
One of Lawrence A. Dean's latest patents focuses on "Systems and Methods for Error Simulation and Code Testing". This innovation is designed to simulate errors in a data storage subsystem by providing abstractions of one or more storage devices. The method involves dividing the data storage subsystem into hierarchically organized subsystems that interact through IO Request Packets (IORPs). Higher-level subsystems generate and pass IORPs to lower-level subsystems for processing. Furthermore, the patent introduces an IORP modifier, which can attach based on specific attributes to modify processing elements and simulate errors effectively.
Career Highlights
Throughout his career, Dean has worked with esteemed companies including Computer Network Technology Corporation and Compellent Technologies. His experiences in these organizations have contributed to his rich understanding of data systems, technology development, and innovation.
Collaborations
Lawrence A. Dean collaborated with notable colleagues such as Anthony J. Floeder and Eugene D. Misukanis. These collaborations have likely enriched his work, fostering an exchange of ideas and expertise in the field of data technology.
Conclusion
In conclusion, Lawrence A. Dean's inventive spirit and professional journey reflect a deep commitment to advancing data storage technology. His patents not only showcase his ingenuity but also underscore his role as a catalyst for innovation in the tech industry. As he continues to influence the field, his contributions will undoubtedly pave the way for future advancements in data processing and error simulation.