Company Filing History:
1 out of 844 
1 out of 2 Years Active: 2021
Title: LaShema M Burrell: Innovator in Surface Anomaly Detection
Introduction
LaShema M Burrell is a notable inventor based in Temple Hills, MD (US). She has made significant contributions to the field of surface anomaly detection, showcasing her innovative spirit and technical expertise. With a focus on developing methods and systems that enhance the detection of anomalies in surfaces, her work is paving the way for advancements in various industries.
Latest Patents
LaShema holds a patent for a "Method and system for detection of anomalies in surfaces." This patent describes a comprehensive approach to identifying anomalies in surfaces, such as pipes. The method involves receiving input that includes the type of surface material and a series of frames from a real-time video stream. It eliminates unwanted frames based on the magnitude of 2-Dimensional optical flow vectors and identifies potential anomaly frames through contour analysis in a dense map. The system detects anomalies in real-time using trained models and classifies them into various anomaly classes through deep learning techniques. Additionally, it generates a health report detailing the anomalies detected, providing valuable information to users.
Career Highlights
Throughout her career, LaShema has worked with reputable organizations, including Wipro Limited and the District of Columbia Water & Sewer Authority. Her experience in these companies has allowed her to apply her innovative ideas and contribute to significant projects in the field of surface anomaly detection.
Collaborations
LaShema has collaborated with talented individuals such as Rupesh Wasudevrao Kumbhare and Deepak Dinkar. These collaborations have further enriched her work and expanded the impact of her inventions.
Conclusion
LaShema M Burrell is a pioneering inventor whose work in surface anomaly detection is making a difference in various sectors. Her innovative methods and systems are essential for improving safety and efficiency in monitoring surface conditions.