Lewiston, ME, United States of America

Larry W Mayes


Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2007-2009

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2 patents (USPTO):

Title: Larry W Mayes: Innovator in Automated Sample Preparation

Introduction

Larry W Mayes is a notable inventor based in Lewiston, ME (US). He has made significant contributions to the field of automated sample preparation, particularly in the context of transmission electron microscopy. With a total of 2 patents to his name, Mayes continues to push the boundaries of innovation in his field.

Latest Patents

One of Larry W Mayes' latest patents is titled "System and method for providing automated sample preparation for plan view transmission electron microscopy." This invention describes a comprehensive system and method for automating the sample preparation process. The process begins with a sample wafer being microcleaved from a semiconductor wafer and mounted on a first support stub. The sample wafer is then cut using an automated diamond sawing tool to reveal a cross-sectional view. After this, the sample wafer is removed and rotated to prepare it for plan view imaging. It is then remounted on a second support stub and cut again to expose a plan view surface. Finally, the remounted sample wafer is prepared for focused ion beam (FIB) milling and plan view transmission electron microscopy imaging.

Career Highlights

Larry W Mayes is currently employed at National Semiconductor Corporation, where he applies his expertise in semiconductor technology and automated processes. His work has been instrumental in enhancing the efficiency and accuracy of sample preparation techniques.

Collaborations

Larry has collaborated with various professionals in his field, including his coworker Mark A Johnson. Their combined efforts contribute to the advancement of technologies in semiconductor research and development.

Conclusion

Larry W Mayes is a distinguished inventor whose work in automated sample preparation has made a significant impact in the field of transmission electron microscopy. His innovative patents and contributions to National Semiconductor Corporation highlight his dedication to advancing technology.

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