Langfeng Wen

Title: Innovations in Optical Measurement: The Contributions of Langfeng Wen

Introduction

Langfeng Wen is a notable inventor based in Beijing, China. He has made significant contributions to the field of optical measurements, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of optical measurement techniques.

Latest Patents

Langfeng Wen holds a patent for a "Method for conducting optical measurement using a full Mueller matrix ellipsometer." This method is designed to improve the process of optical measurements by utilizing a full Mueller matrix ellipsometer. The technique involves constructing an experimental optical path, conducting complete regression calibration, and obtaining experimental Fourier coefficients from samples. This approach not only simplifies the measurement process but also enhances the accuracy of the results.

Career Highlights

Wen is currently associated with Ak Optics Technology Co., Ltd., where he applies his expertise in optical measurements. His innovative methods have contributed to advancements in the field, making him a valuable asset to his company and the industry.

Collaborations

Throughout his career, Langfeng Wen has collaborated with talented individuals such as Tao Liu and Gaozeng Cui. These partnerships have fostered a creative environment that encourages the development of new ideas and technologies in optical measurement.

Conclusion

Langfeng Wen's contributions to the field of optical measurements through his innovative patent demonstrate his commitment to advancing technology. His work not only simplifies measurement processes but