Company Filing History:
Years Active: 2016
Title: Innovations of Krishna Kuchibhotla
Introduction
Krishna Kuchibhotla is an accomplished inventor based in San Jose, California. He has made significant contributions to the field of optical probing technology, particularly in the context of integrated circuits (ICs). His innovative approach has led to the development of a unique patent that enhances signal strength during testing.
Latest Patents
Kuchibhotla holds a patent for an invention titled "Adjustable Split-Beam Optical Probing (ASOP)." This practical method greatly enhances the strength of the modulated signal from laser probing of ICs. The technique involves scanning an IC device under test (DUT) with two spatially separated laser beams. The output from a single laser source is split into two components, each focused on different areas of the DUT. The separation and intensity of the beams are adjustable to maximize the strength of the modulated return signal. Typically, a near-infrared (NIR) laser is used with flip-chip IC devices to account for the transmission characteristics of the substrate material. Upon reflection from the DUT, the beams are recombined to interfere with one another, allowing for adjustable phase differences to achieve maximum interference. This method significantly improves the signal-to-noise ratio and reduces the time required to acquire useful voltage waveforms.
Career Highlights
Kuchibhotla is currently employed at Checkpoint Technologies LLC, where he continues to innovate in the field of optical probing. His work has been instrumental in advancing testing methodologies for integrated circuits, making significant contributions to the efficiency and effectiveness of electronic testing processes.
Collaborations
Some of his notable coworkers include Horst E Groneberg and Guoqing Xiao, who have collaborated with him on various projects within the company.
Conclusion
Krishna Kuchibhotla's innovative work in optical probing technology has made a lasting impact on the field of integrated circuit testing. His patent for the Adjustable Split-Beam Optical Probing method exemplifies his commitment to enhancing signal strength and improving testing efficiency.