Kook In Han

Title: Kook In Han - Innovator in Wear Measurement Systems

Introduction

Kook In Han is a notable inventor based in Savoy, IL (US). He has made significant contributions to the field of wear measurement systems, holding a total of 2 patents. His innovative work focuses on utilizing advanced imaging techniques to assess wear in various components.

Latest Patents

Kook In Han's latest patents include a "Wear Measurement System Using a Computer Model" and a "Wear Measurement System Using Computer Vision." The first patent describes a system that employs an imaging device to capture multiple two-dimensional images of a component. A controller generates a three-dimensional point cloud from these images and overlays a computer model on it. This system allows for the selection of reference points in the images to determine wear based on the distance between these points in the three-dimensional representation. The second patent similarly outlines a wear measurement system that utilizes an imaging device and a controller to analyze wear by determining image distances between reference points in a three-dimensional point cloud.

Career Highlights

Kook In Han is currently employed at Caterpillar Inc., where he continues to develop innovative solutions in wear measurement technology. His work has been instrumental in enhancing the accuracy and efficiency of wear assessments in various applications.

Collaborations

Kook has collaborated with notable colleagues, including Nolan S Finch and Yue Wang, who contribute to the innovative environment at Caterpillar Inc. Their combined expertise fosters advancements in the field of wear measurement systems.

Conclusion

Kook In Han's contributions to wear measurement technology exemplify the impact of innovation in engineering. His patents reflect a commitment to improving measurement accuracy and efficiency, making significant strides in the industry.