Hsinchu, Taiwan

Klaus G F Enk


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Klaus G F Enk: Innovator in Memory Device Testing

Introduction

Klaus G F Enk is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of memory devices, particularly through his innovative patent work. His expertise and dedication to advancing technology have positioned him as a key figure in his industry.

Latest Patents

Klaus G F Enk holds a patent titled "Apparatus and method for performing a defect leakage screen test for memory devices." This invention addresses critical aspects of memory device testing, ensuring reliability and performance in electronic applications. He has 1 patent to his name, showcasing his focused contributions to technological advancements.

Career Highlights

Klaus is currently employed at International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to collaborate with some of the brightest minds in the industry, further enhancing his innovative capabilities. His work has been instrumental in developing solutions that meet the evolving demands of technology.

Collaborations

Klaus has worked alongside talented colleagues, including Michael P Clinton and Russell J Houghton. These collaborations have fostered an environment of creativity and innovation, leading to the development of impactful technologies.

Conclusion

Klaus G F Enk is a distinguished inventor whose work in memory device testing exemplifies the spirit of innovation. His contributions continue to influence the field, and his collaborations with esteemed colleagues further enhance his impact on technology.

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