Kiyoshi Sugaya is a notable inventor based in Ibaragi, Japan. He has made significant contributions to the field of probing equipment for integrated circuits (ICs). With a total of 4 patents to his name, Sugaya's work focuses on enhancing the efficiency and accuracy of IC testing.

Latest Patents

One of Sugaya's latest patents is a probe card designed to improve the contact pressure and relative positioning of each probe. This innovative probe card is an essential component of probing equipment used to test finished IC chips. Traditionally, aligning the probe front ends with the electrical ends of the IC chip has been a challenge. Sugaya's design incorporates a resin layer with elastic and insulative properties, which fills the central open area of the supporter within the probe card. This feature ensures that the probe front ends are resiliently held in position, preventing deviations caused by overdrive. Additionally, the patent includes devices that facilitate better alignment and accurate measurements of the IC chips under test.

Career Highlights

Throughout his career, Kiyoshi Sugaya has worked with various companies, including Nihon Denshizairyo Kabushiki Kaisha. His expertise in probe card technology has positioned him as a key figure in the industry, contributing to advancements that enhance testing processes for ICs.

Collaborations

Sugaya has collaborated with notable individuals such as Masao Okubo and Kazumasa Okubo. These partnerships have likely played a role in the development and refinement of his innovative technologies.

Conclusion

Kiyoshi Sugaya's contributions to probe card technology have significantly impacted the efficiency of IC testing. His innovative designs and collaborative efforts continue to shape advancements in the field.

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