Company Filing History:
Years Active: 2004
Title: Kiyonori Nishikawa: Innovator in Electromagnetic Flow Measurement
Introduction
Kiyonori Nishikawa is a prominent inventor based in Tokyo, Japan. He is known for his innovative contributions to the field of electromagnetic flow measurement technology. His work has significantly advanced the capabilities of flow measurement devices, making them more efficient and reliable.
Latest Patents
Kiyonori Nishikawa holds a patent for a capacitative electromagnetic flow meter. This invention features excitation performed at a frequency above the commercially available frequency. It includes a characteristic correction filter that corrects the gain frequency characteristic of the exciting current, ensuring that the exciting flux waveform has a flat section. The detection unit is designed such that the electrostatic capacitance between the face electrodes A, B and guard electrodes A, B is smaller than the capacitance between the detecting face electrodes A, B and the fluid being measured. The exciting coils are fixed to a cylindrical yoke, which is electrostatically screened by coil fixing plates. Additionally, the entire interior of the detection unit is filled with epoxy resin for enhanced stability.
Career Highlights
Kiyonori Nishikawa has made significant strides in his career, particularly through his work at Kabushiki Kaisha Toshiba. His innovative approach to flow measurement technology has positioned him as a key figure in the industry. His patent reflects his commitment to improving measurement accuracy and efficiency.
Collaborations
Kiyonori has collaborated with notable colleagues, including Hiroshi Nakatani and Tatsuya Kimura. Their combined expertise has contributed to the development of advanced technologies in their field.
Conclusion
Kiyonori Nishikawa's contributions to electromagnetic flow measurement technology exemplify his innovative spirit and dedication to advancing engineering solutions. His patent for the capacitative electromagnetic flow meter showcases his ability to address complex challenges in measurement technology.