Seoul, South Korea

Keun Ha Koh


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Keun Ha Koh: Innovator in Semiconductor Technology

Introduction

Keun Ha Koh is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent that addresses critical challenges in the industry.

Latest Patents

One of his notable patents is a fabrication method of a semiconductor test piece. This method involves thinning one substrate of a pair of bonded semiconductor substrates, grade-polishing the thinned semiconductor substrate and the bonded semiconductor substrates to achieve a predetermined graded angle relative to their bonded surfaces. Additionally, the process includes dry-etching an area around the bonded surfaces of the grade-polished semiconductor substrates to reveal faults. With this fabricated test piece, micro non-contact regions can be easily observed, and crystal faults existing on the bonded surfaces, as well as in the micro non-contact regions, can be effectively detected. This innovation has the potential to enhance the efficiency and accuracy of semiconductor testing.

Career Highlights

Keun Ha Koh is affiliated with the Korea Institute of Science and Technology, where he continues to advance research and development in semiconductor technologies. His work has garnered attention for its practical applications and contributions to the field.

Collaborations

He collaborates with esteemed colleagues, including Byeong Kwon Ju and Myung Hwan Oh, who contribute to the innovative environment at the Korea Institute of Science and Technology.

Conclusion

Keun Ha Koh's contributions to semiconductor technology through his innovative patent demonstrate his commitment to advancing the field. His work not only addresses existing challenges but also paves the way for future developments in semiconductor testing.

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