Company Filing History:
Years Active: 2000
Title: Kerry Ken Kanbe: Innovator in Memory Device Testing
Introduction
Kerry Ken Kanbe, an esteemed inventors based in Austin, TX, has made significant contributions to the field of integrated memory device testing. With a patent to his name, he has developed a method that enhances the reliability of memory arrays in electronic devices. His innovative approach to defect detection in memory systems reflects his commitment to advancing technology.
Latest Patents
Kerry Ken Kanbe holds a patent titled "Method and apparatus for testing an integrated memory device". This invention addresses the limitations of traditional memory array testing by detecting defects sensitive to environmental conditions. The method generates a repair signature that indicates the repair state of the memory. If there is a change in the repair signature over the device's operating range, the memory device is rejected. His innovation includes an integrated circuit featuring a memory array, spare memory elements for repairs, a built-in self-test (BIST) circuit for fault detection, and a built-in self-repair (BISR) circuit.
Career Highlights
Kanbe is currently affiliated with Motorola Corporation, a leading company in the telecommunications sector. His work at Motorola has positioned him at the forefront of electronic device innovation, where he continues to develop solutions that enhance the performance and durability of memory devices.
Collaborations
Throughout his career, Kerry Ken Kanbe has collaborated with notable colleagues, including Grady L Giles and William Clayton Bruce, Jr. Their combined expertise has contributed to advancing technologies in memory integration and performance, reflecting a strong collaborative spirit within the company.
Conclusion
Kerry Ken Kanbe's contributions to memory device technology through his innovative patents have established him as a notable inventor in the field. His method for testing integrated memory devices not only improves fault detection but also enhances device reliability under varying environmental conditions. His ongoing work at Motorola Corporation continues to inspire advancements in electronic memory systems.