Company Filing History:
Years Active: 2003-2015
Title: Kenzo Nishide: Innovator in RFID Technology and Integrated Circuit Analysis
Introduction
Kenzo Nishide is a prominent inventor based in Kawasaki, Japan. He has made significant contributions to the fields of RFID technology and integrated circuit analysis. With a total of two patents to his name, Nishide's work reflects his expertise and innovative spirit.
Latest Patents
One of Nishide's latest patents is an RFID tag that includes an inlay with a sheet-like shape, which contains an antenna and an IC chip electrically connected to the antenna. The outer covering member of the tag has a planar shape, featuring a main surface and a rear surface, with a frame part arranged on at least one of these surfaces. This frame part is erected in the thickness direction of the outer covering member and surrounds the IC chip in a plan view.
Another notable patent is a short-circuit failure analyzing method and apparatus. This invention involves changing the logical state in an integrated circuit and forming a plurality of measurement patterns for a quiescent power source current test. By deriving internal state values and obtaining pass or fail test results, the method allows for the discrimination of short-circuit failure positions within the integrated circuit.
Career Highlights
Kenzo Nishide is currently employed at Fujitsu Corporation, where he continues to develop innovative solutions in technology. His work has been instrumental in advancing the capabilities of RFID systems and integrated circuit testing.
Collaborations
Nishide has collaborated with notable coworkers, including Takayoshi Matsumura and Shigeru Gotou. Their combined efforts contribute to the innovative projects at Fujitsu Corporation.
Conclusion
Kenzo Nishide's contributions to RFID technology and integrated circuit analysis highlight his role as a leading inventor in his field. His patents demonstrate a commitment to innovation and problem-solving in technology.