Company Filing History:
Years Active: 2009
Title: Innovations of Kensuke Ichinose in Semiconductor Stress Measurement
Introduction
Kensuke Ichinose is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology, particularly in stress measurement methods. His innovative approach has led to the development of a unique patent that enhances the accuracy of stress detection in semiconductor wafers.
Latest Patents
Kensuke Ichinose holds a patent for a "Stress measuring method and instrument." This invention allows for the detection of the stress of a sample semiconductor wafer with high accuracy, presenting the results in absolute values without the need to rotate the sample or the entire optical system. The method utilizes laser light subjected to photoelastic modulation to generate a birefringence phase difference. This light passes through quarter wavelength plates and a semiconductor wafer, enabling the detection of stress direction based on specific angles of polarization. The transmitted electric signal is processed to generate transmission signal data, which is crucial for accurate stress measurement.
Career Highlights
Kensuke Ichinose is affiliated with Tokyo Denki University, where he continues to advance research in semiconductor technologies. His work has been instrumental in improving the methodologies used in stress measurement, which is vital for the integrity and performance of semiconductor devices.
Collaborations
Kensuke has collaborated with esteemed colleagues such as Yasushi Niitsu and Kenji Gomi. Their combined expertise has contributed to the development of innovative solutions in the field of semiconductor stress measurement.
Conclusion
Kensuke Ichinose's contributions to semiconductor technology through his innovative stress measurement methods highlight the importance of precision in this field. His patent reflects a significant advancement that can enhance the reliability of semiconductor devices.