Cincinnati, OH, United States of America

Kenneth E Miller

This inventor holds 1 USPTO granted patent. Top assignee: General Electric Company. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenneth E Miller. Retrieved from https://idiyas.com/inventor/kenneth-e-miller-zp7oot1j

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 46(Granted Patents)


Company Filing History:


Years Active: 1996

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Kenneth E. Miller

Introduction

Kenneth E. Miller is a notable inventor based in Cincinnati, OH, recognized for his innovative approach to measuring surface contours. With a focus on precision and accuracy, Miller has made significant contributions to the field of optical measurement.

Latest Patents

Miller holds a patent for a "Method for measuring the contour of a surface." This method utilizes a high-intensity light source and optics to project a line of light onto a surface, illuminating selected contour features. An optical detector captures an image of these features, while a processing unit fits contour segments to the image and determines contour characteristics. The method also includes a calibration step to correct for distortion and keystone effects, ensuring accurate measurements.

Career Highlights

Miller's career is marked by his work at General Electric Company, where he has applied his expertise in optical measurement technologies. His innovative methods have enhanced the capabilities of surface contour measurement, contributing to advancements in various engineering and manufacturing processes.

Collaborations

Miller has collaborated with esteemed colleagues such as Charles W. Donaldson and John J. Lestage, further enriching his work and expanding the impact of his inventions.

Conclusion

Kenneth E. Miller's contributions to the field of optical measurement through his patented methods demonstrate his commitment to innovation and precision. His work continues to influence the industry and inspire future advancements in measurement technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…