Kenneth Cheng Hoe Nai

Title: Innovations by Kenneth Cheng Hoe Nai

Introduction

Kenneth Cheng Hoe Nai is a notable inventor based in Bristol, GB. He has made significant contributions to the field of measurement systems, holding two patents that showcase his innovative approach to technology.

Latest Patents

Kenneth's latest patents include a "Probe head for scanning the surface of a workpiece" and a "Method for scanning the surface of a workpiece." Both patents describe a measurement system that features a surface sensing device mounted on an articulating probe head. This probe head is attached to a coordinate positioning apparatus, allowing the surface sensing device to move relative to a surface. The system is designed to drive at least one of the coordinate positioning apparatus and probe head in at least one axis to effectively scan the surface. The surface sensing device measures its distance from the surface, and the probe head is capable of rotating the sensing device about at least one axis. This functionality enables the control of the relative position of the surface sensing device from the surface within a predetermined range in real time.

Career Highlights

Kenneth Cheng Hoe Nai is currently employed at Renishaw Plc, a company known for its advanced engineering and manufacturing solutions. His work at Renishaw has allowed him to develop and refine his innovative ideas in measurement technology.

Collaborations

Throughout his career, Kenneth has collaborated with notable colleagues such as Geoffrey McFarland and Nicholas John Weston. These collaborations have contributed to the advancement of his projects and the successful development of his patents.

Conclusion

Kenneth Cheng Hoe Nai is a distinguished inventor whose work in measurement systems has led to significant advancements in technology. His patents reflect a commitment to innovation and precision in engineering.