Company Filing History:
Years Active: 1998
Title: Innovations of Kenneth Birdwell
Introduction
Kenneth Birdwell is an accomplished inventor based in Belleview, WA (US). He is known for his innovative contributions to the field of object imaging technology. His work has led to the development of a unique device and method that enhances the accuracy and efficiency of obtaining surface contour information from various objects.
Latest Patents
Kenneth Birdwell holds a patent for an object imaging device and method using line striping. This invention provides a solution for quickly and accurately obtaining surface contour information without the need for precise alignment or calibration of mechanical structures or optical elements. The method involves projecting a series of parallel planes of laser light onto the surface of an object, capturing the reflected image with a digital camera, and processing the image to reconstruct a three-dimensional representation of the object's surface. The image processing includes subtracting the non-illuminated image from the illuminated one, performing thresholding operations, and generating a line array that reflects surface deviations.
Career Highlights
Kenneth Birdwell has made significant strides in his career, particularly through his work at Nike, Inc. His innovative approach to imaging technology has positioned him as a valuable asset in the field. His patent reflects his commitment to advancing technology and improving methods of surface contour analysis.
Collaborations
Throughout his career, Kenneth has collaborated with notable colleagues, including Robert E. Borchers and Bruce J. Kilgore. These collaborations have contributed to the development and refinement of his innovative technologies.
Conclusion
Kenneth Birdwell's contributions to object imaging technology exemplify the spirit of innovation. His patent for an object imaging device showcases his ability to solve complex problems in a practical manner. His work continues to influence advancements in imaging technology and surface analysis.