Kenji Imanishi

Title: Kenji Imanishi: Innovator in Semiconductor Technology

Introduction

Kenji Imanishi is a notable inventor based in Kobe, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the measurement of rotational misalignment in bonded substrates. His innovative work has led to the development of a patented device that enhances the precision of semiconductor manufacturing.

Latest Patents

Kenji Imanishi holds a patent for a "Rotational misalignment measuring device of bonded substrate, rotational misalignment measuring method of bonded substrate, and method of manufacturing bonded substrate." This invention involves calculating the rotational misalignment between semiconductor wafers that constitute a bonded wafer. The device utilizes a light source positioned strategically to irradiate the outer edge of the bonded wafer, allowing for accurate measurement of misalignment through image analysis.

Career Highlights

Throughout his career, Kenji Imanishi has worked with prominent companies such as Kobe Steel, Ltd. and Kobelco Research Institute, Inc. His experience in these organizations has contributed to his expertise in semiconductor technology and innovation.

Collaborations

Kenji Imanishi has collaborated with notable colleagues, including Masato Kannaka and Masakazu Kajita. These partnerships have fostered a collaborative environment that encourages innovation and the advancement of technology in their field.

Conclusion

Kenji Imanishi's contributions to semiconductor technology through his patented innovations demonstrate his commitment to advancing the industry. His work continues to influence the precision and efficiency of semiconductor manufacturing processes.