Company Filing History:
Years Active: 2004-2010
Title: Keith V Groeschel: Innovator in Flow Meter Technology
Introduction
Keith V Groeschel is a notable inventor based in Houston, TX (US), recognized for his contributions to flow meter technology. With a total of 4 patents, Groeschel has made significant advancements in the field, particularly in the coordination and configuration of measurement subsystems.
Latest Patents
Groeschel's latest patents include a method and system for the coordination of measurement subsystems of a flow meter. This innovative design features flow meters that comprise a spool piece defining a central passage, along with a first plurality of transducer pairs mechanically coupled to the spool piece. The system includes first control electronics that are electrically coupled to the first plurality of transducer pairs, allowing for selective activation of each transducer pair. Additionally, a second plurality of transducer pairs is also mechanically coupled to the spool piece, with a second control electronics configured to coordinate the activation of their respective transducer pairs. Another significant patent is for a driver configuration for an ultrasonic flow meter, which includes a spool piece that couples within a flow of fluids, along with upstream and downstream transducers that work in operational relationship to each other.
Career Highlights
Throughout his career, Groeschel has worked with reputable companies such as Daniel Industries, Inc. and Daniel Measurement and Control, Inc. His experience in these organizations has contributed to his expertise in flow meter technology and innovation.
Collaborations
Groeschel has collaborated with notable professionals in the industry, including Vipin Malik and Henry Charles Straub, Jr. These collaborations have further enhanced his work and contributions to the field.
Conclusion
Keith V Groeschel stands out as an influential inventor in the realm of flow meter technology. His innovative patents and career achievements reflect his dedication to advancing measurement systems.