Location History:
- Kawasaki, JP (1996)
- Yokosuka, JP (2022)
- Tokyo, JP (1995 - 2024)
Company Filing History:
Years Active: 1995-2024
Title: Keisuke Hasegawa: Innovator in Information Integration
Introduction
Keisuke Hasegawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of information integration, holding a total of 8 patents. His work focuses on improving the accuracy and efficiency of position information related to objects measured by multiple sensors.
Latest Patents
Hasegawa's latest patents include an information integration method, an information integration device, and an information integration program. These inventions aim to reduce the influence on object expression performed at a transmission destination. The position information reception unit of his information integration device receives data regarding objects measured by various sensors from multiple locations. It calculates the smallest or largest rectangles surrounding these objects using the position information for each location. Additionally, his inventions improve the accuracy of position information by associating labels included in tracking data with object areas that have the largest ratio of overlapping areas.
Career Highlights
Throughout his career, Hasegawa has worked with notable companies such as Nippon Telegraph and Telephone Corporation and Canon Inc. His experience in these organizations has allowed him to develop innovative solutions that address complex challenges in information integration.
Collaborations
Hasegawa has collaborated with talented individuals in his field, including Masato Ono and Koji Namba. These partnerships have contributed to the advancement of his research and the successful development of his patents.
Conclusion
Keisuke Hasegawa is a distinguished inventor whose work in information integration has led to significant advancements in the field. His innovative patents and collaborations with industry professionals highlight his commitment to improving technology and accuracy in object measurement.