Tokyo, Japan

Kei Nishida


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 1981

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1 patent (USPTO):Explore Patents

Title: Kei Nishida: Innovator in Flaw Detection Technology

Introduction

Kei Nishida is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of flaw detection technology, particularly with his innovative patent that enhances the examination of bottle openings.

Latest Patents

Nishida holds a patent for a flaw detecting apparatus. This invention includes a light source, a light projecting body, a plurality of optical fiber bundles, and a sensor. The design features a central bore aligned with the sensor and multiple passages for the fiber bundles. The central bore is designed to be equal to or larger than the mouth of the bottle being examined. The apertures connect to the central bore at a point that corresponds to the periphery of the bottle's mouth, ensuring precise alignment for effective flaw detection.

Career Highlights

Throughout his career, Kei Nishida has worked with several companies, including Hajime Industries Ltd. and Nihon Pillow Block Mfg. Co. His experience in these organizations has contributed to his expertise in developing innovative technologies.

Collaborations

Nishida has collaborated with notable individuals in his field, including Hajime Yoshida and Takashi Aoki. These partnerships have likely fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

Kei Nishida's contributions to flaw detection technology exemplify his innovative spirit and dedication to improving industrial processes. His patent reflects a significant advancement in the field, showcasing his ability to merge technology with practical applications.

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