Company Filing History:
Years Active: 1996-1998
Title: Ke Luo: Innovator in Scanning Microscopy Technologies
Introduction
Ke Luo is a prominent inventor based in Goleta, California. He has made significant contributions to the field of scanning microscopy through his innovative patents. With a total of 2 patents, Luo's work focuses on the fabrication of sensors that enhance the capabilities of atomic force microscopy.
Latest Patents
Luo's latest patents include groundbreaking methods for using focused ion and electron beams to fabricate sensors on probe tips. One of his patents describes how nanometer holes can be reliably defined in the tips of cantilevered probes. This technology allows for the creation of various types of scanning multiprobe microscopy. The process involves drilling a hole at the apex of the tip, which is then backfilled with a metallic or semiconductor layer to form an active electrical junction. This innovation enables multiple physical interactions between the fabricated tip and the scanned sample, resulting in high-quality scanned images.
Another patent outlines a method for fabricating a sensor on a probe tip used for atomic force microscopy. This method involves defining a hole within a conductive layer on the tip, utilizing the field strengths at the apex to evaporate the conductive material onto a sample substrate. Similar to his other patent, this technique allows for the definition of Schottky diodes, thermocouple junctions, and near-field optical detectors, enhancing the functionality of atomic force tips.
Career Highlights
Ke Luo is affiliated with the University of California, where he continues to advance research in the field of microscopy. His innovative approaches have positioned him as a key figure in the development of advanced sensor technologies.
Collaborations
Luo has collaborated with notable colleagues such as Arunava Majumdar and Jie Lai. These partnerships have further enriched his research and contributed to the advancement of technology in his field.
Conclusion
Ke Luo's contributions to scanning microscopy through his innovative patents demonstrate his commitment to advancing technology. His work not only enhances the capabilities of existing tools but also opens new avenues for research and application in various scientific fields.