Osaka, Japan

Katsuhiro Kondoh


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1995-1998

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2 patents (USPTO):Explore Patents

Title: Katsuhiro Kondoh: Innovator in Wiring Pattern Inspection Technology

Introduction

Katsuhiro Kondoh is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of wiring pattern inspection for printed circuit boards. With a total of 2 patents to his name, Kondoh's work has advanced the technology used in electronic manufacturing.

Latest Patents

One of his latest patents is a wiring pattern inspection apparatus designed for inspecting abnormalities in wiring patterns formed on printed circuit boards. This innovative apparatus is equipped with an optical image pickup device that optically illuminates the surface of the printed circuit board. The optical illumination allows for the photoelectric conversion of optical information into a grey level image. This grey level image is then converted into a bi-level image, which effectively separates the wiring pattern from the background. The bi-level image undergoes a contraction and expansion process to eliminate micro conductive portions or micro pinholes that can be disregarded during abnormality inspections, thus preventing excessive detection.

Career Highlights

Katsuhiro Kondoh has been associated with Matsushita Electric Industrial Co., Ltd., where he has played a crucial role in developing advanced inspection technologies. His expertise in optical imaging and pattern recognition has positioned him as a key figure in the field.

Collaborations

Kondoh has collaborated with notable coworkers, including Hideaki Kawamura and Atsuharu Yamamoto, contributing to various projects that enhance the capabilities of wiring pattern inspection technologies.

Conclusion

Katsuhiro Kondoh's innovative work in wiring pattern inspection technology has made a significant impact on the electronics industry. His patents reflect a commitment to improving the accuracy and efficiency of printed circuit board inspections.

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