Taipei, Taiwan

Kang-Nin Lin


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2011

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Kang-Nin Lin

Introduction

Kang-Nin Lin is a prominent inventor based in Taipei, Taiwan. He is known for his contributions to the field of integrated circuits, particularly in developing technologies that enhance testing capabilities. His work has significantly impacted the efficiency and reliability of electronic devices.

Latest Patents

Kang-Nin Lin holds a patent for an "Integrated circuit with built-in self test circuit." This invention provides an integrated circuit that includes an analog device-under-test (DUT), a memory for storing a test program, and a processor. The processor is responsible for testing the analog DUT and outputs a test result in digital format by executing the test program. The test result indicates whether the analog DUT is workable according to a specification. This innovation is crucial for improving the testing processes in electronic devices.

Career Highlights

Kang-Nin Lin is currently employed at MediaTek Corporation, a leading global semiconductor company. His role involves developing advanced technologies that contribute to the company's success in the competitive electronics market. His expertise in integrated circuits has made him a valuable asset to the organization.

Collaborations

Kang-Nin Lin has collaborated with notable colleagues, including Chun-Yu Lin and Shiue-Shin Liu. These partnerships have fostered innovation and have led to the development of cutting-edge technologies in the field of electronics.

Conclusion

Kang-Nin Lin's contributions to integrated circuit technology exemplify the importance of innovation in the electronics industry. His patent for an integrated circuit with built-in self-test capabilities showcases his commitment to enhancing device reliability and efficiency. His work continues to influence the future of electronic testing and development.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…