Kanad Basu

Title: Kanad Basu: Innovator in Automatic Test Pattern Generation

Introduction

Kanad Basu is a prominent inventor based in Bengaluru, India. He has made significant contributions to the field of automatic test pattern generation (ATPG), particularly in addressing crosstalk effects. His innovative approach has paved the way for advancements in testing methodologies within the electronics industry.

Latest Patents

Kanad Basu holds a patent for "Automatic test pattern generation (ATPG) considering crosstalk effects." This patent focuses on incorporating crosstalk fault models into ATPG processes. It involves determining paths and nodes that need to be sensitized to activate each crosstalk fault. The optimization process aims to enable the detection of as many crosstalk faults as possible while adhering to specific constraints. These constraints may include threshold numbers of endpoints or observation points, as well as attempts to sensitize intermediate nodes in a crosstalk fault model path.

Career Highlights

Kanad Basu is currently employed at International Business Machines Corporation (IBM), where he continues to innovate and contribute to the field of electronic testing. His work has been instrumental in enhancing the reliability and efficiency of testing processes in complex electronic systems.

Collaborations

Throughout his career, Kanad has collaborated with notable colleagues, including Raghu Gaurav GopalaKrishnaSetty and Hari Krishnan Rajeev. These collaborations have fostered a dynamic environment for innovation and problem-solving in the realm of electronic testing.

Conclusion

Kanad Basu's contributions to automatic test pattern generation highlight his expertise and commitment to advancing technology in the electronics industry. His innovative patent addressing crosstalk effects demonstrates the importance of thorough testing methodologies in ensuring the reliability of electronic devices.