Jyuntaro Arima

Title: Jyuntaro Arima: Innovator in Surface Structure Measurement

Introduction

Jyuntaro Arima is a notable inventor based in Katsuta, Japan. He has made significant contributions to the field of surface structure measurement, particularly through his innovative patent. His work is recognized for its impact on the accuracy and efficiency of measuring sample surfaces.

Latest Patents

Arima holds a patent for a "Sample surface structure measuring method." This method utilizes a scanning type electron microscope to scan the sample surface with an electron beam. It measures the amount of secondary electrons discharged based on the three-dimensional structure of the sample surface. The method determines the three-dimensional structure from the measured secondary electrons, establishing a relationship between the structure and the electron discharge.

Career Highlights

Jyuntaro Arima is associated with Hitachi, Ltd., where he has contributed to various projects and innovations. His expertise in electron microscopy and surface measurement techniques has positioned him as a valuable asset in his field.

Collaborations

Arima has worked alongside notable colleagues such as Makoto Kato and Tetsuo Yokoyama. Their collaborative efforts have further advanced the research and development of measurement technologies.

Conclusion

Jyuntaro Arima's contributions to surface structure measurement through his innovative patent highlight his role as a leading inventor in this specialized field. His work continues to influence advancements in measurement techniques and technologies.