Lorrach, Germany

Jurgen Lau


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Jurgen Lau - Innovator in Radar Measurement Technology

Introduction

Jurgen Lau is a notable inventor based in Lorrach, Germany. He has made significant contributions to the field of radar measurement technology, particularly in the area of material level measurement in containers. His innovative approach has led to the development of a unique patent that enhances the accuracy and reliability of measuring material levels.

Latest Patents

Jurgen Lau holds a patent for a radar-based method of measuring the level of a material in a container. This method utilizes microwaves that are radiated downwards and reflected back to an antenna positioned above the anticipated highest level of the material. The system evaluates the received microwaves to determine the distance of the material surface from the antenna, even in challenging conditions such as curved container bottoms. This innovation ensures reliable detection of the empty condition of containers, enhancing operational efficiency.

Career Highlights

Jurgen Lau is associated with Endress + Hauser GmbH + Co., a leading company in process automation and instrumentation. His work at the company has been pivotal in advancing radar measurement technologies. With a focus on practical applications, Lau's inventions have contributed to improved measurement techniques in various industrial settings.

Collaborations

Throughout his career, Jurgen Lau has collaborated with esteemed colleagues, including Carsten Fitsch and Wolfgang Lubcke. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Jurgen Lau's contributions to radar measurement technology exemplify the impact of innovative thinking in industrial applications. His patent for measuring material levels in containers showcases his commitment to enhancing measurement accuracy and reliability. His work continues to influence the field and inspire future innovations.

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