Company Filing History:
2 out of 32 
2 out of 1,430 
Years Active: 1997
Title: Junju Itoh: Innovator in Atomic Force Microscopy
Introduction
Junju Itoh is a notable inventor based in Ibaraki-ken, Japan. He has made significant contributions to the field of atomic force microscopy, holding 2 patents that showcase his innovative approach to technology.
Latest Patents
His latest patents include an improved cantilever for use with an atomic force microscope. This invention features a single-crystal silicon base that provides adequate mechanical strength. The cantilever beam is constructed from a silicon oxide film and is joined at one end to the base. At the opposite end, a conical stylus with a sharp tip, made of single-crystal silicon, is attached. All surfaces of the cantilever are covered with a thin electroconductive film. Additionally, protective plates can be included to shield the cantilever beam from mechanical damage. The stylus is designed with an abrupt profile and a high aspect ratio, while the cantilever beam maintains an invariable spring constant to support the stylus effectively.
Career Highlights
Throughout his career, Junju Itoh has worked with esteemed organizations such as Ebara Research Co., Ltd. and the Agency of Industrial Science and Technology. His experience in these companies has contributed to his expertise in the field of atomic force microscopy.
Collaborations
One of his notable collaborators is Yasushi Toma, with whom he has likely shared insights and advancements in their research endeavors.
Conclusion
Junju Itoh's contributions to atomic force microscopy through his innovative patents and collaborations highlight his role as a significant inventor in this specialized field. His work continues to influence advancements in technology and research methodologies.