Jung-Sun Yoo

Title: Innovations of Jung-Sun Yoo in Probe Card Technology

Introduction

Jung-Sun Yoo is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of probe card technology, which is essential for inspecting electronic components. His innovative approach has led to the development of a unique substrate that enhances the efficiency and cost-effectiveness of probe cards.

Latest Patents

Jung-Sun Yoo holds a patent for a "Substrate of probe card and method for regenerating thereof." This invention provides a substrate designed for installing multiple probes to inspect objects by making contact with them. The substrate features main channels that are electrically connected to the probes, along with at least one spare channel that can replace any damaged main channels. This design allows for the repair of damaged channels using spare ones, enabling the reuse of the probe substrate and significantly reducing costs associated with unnecessary replacements.

Career Highlights

Jung-Sun Yoo is currently employed at Phicom Corporation, where he continues to innovate in the field of electronic testing technologies. His work has not only advanced the capabilities of probe cards but has also contributed to the overall efficiency of electronic inspections in various industries.

Collaborations

Jung-Sun Yoo collaborates with Seong-Hoon Jeong, a talented woman in the field, to further enhance their research and development efforts. Their teamwork exemplifies the importance of collaboration in driving innovation.

Conclusion

Jung-Sun Yoo's contributions to probe card technology demonstrate his commitment to innovation and efficiency in electronic inspections. His patented designs and collaborative efforts continue to shape the future of this essential technology.