Junfei Yi

Title: Innovations of Junfei Yi in Defect Detection for Aircraft Skin

Introduction

Junfei Yi is a notable inventor based in Changsha, China. He has made significant contributions to the field of defect detection, particularly in the quality assessment of gluing on aircraft skin. His innovative approach utilizes advanced neural network techniques to enhance the reliability and efficiency of defect detection processes.

Latest Patents

Junfei Yi holds a patent for a "Neural network-based defect detection method for gluing quality on aircraft skin." This invention outlines a comprehensive method that includes data acquisition through photography, preprocessing of image data, and the establishment of a defect detection network model. The model incorporates various components such as feature extraction, semantic-guided feature erasure, multi-scale feature fusion, and defect prediction based on boundary refinement. The trained model is then utilized to detect defects in gluing quality, providing valuable results for aircraft maintenance.

Career Highlights

Junfei Yi is affiliated with Hunan University, where he contributes to research and development in the field of engineering and technology. His work focuses on integrating artificial intelligence with practical applications in the aerospace industry. His innovative methods have the potential to significantly improve quality control processes in aircraft manufacturing.

Collaborations

Junfei Yi collaborates with esteemed colleagues such as Jianxu Mao and Yaonan Wang. Their combined expertise enhances the research and development efforts in defect detection technologies.

Conclusion

Junfei Yi's contributions to the field of defect detection through his innovative patent demonstrate the importance of integrating advanced technologies in aerospace applications. His work not only advances the field but also sets a precedent for future innovations in quality assurance.