Jun Zou

Title: Jun Zou: Innovator in Scanning Probe Microscopy

Introduction

Jun Zou is a prominent inventor based in Urbana, IL (US). He has made significant contributions to the field of scanning probe microscopy, holding a total of 3 patents. His work focuses on innovative methods and devices that enhance the capabilities of microscopy techniques.

Latest Patents

One of Jun Zou's latest patents is titled "Scanning probe microscopy probes and methods." This patent discloses a method for fabricating scanning probe microscopy (SPM) probes. The probes are created by forming a structural layer on a substrate that contains a cavity. A sacrificial layer is positioned between the substrate and the structural layer. After the structural layer is formed, the sacrificial layer is selectively removed, allowing the probe to be released from the substrate. This method also allows for the substrate to be reused for additional probes. Another notable patent is "Raised on-chip inductor and method of manufacturing same." This patent describes a raised on-chip planar inductor, which is fabricated on a substrate. The inductor is lifted from the substrate, except for an anchoring extremity, by applying a magnetic field to a magnetic layer formed on the inductor. This innovative approach allows the inductor to remain raised after the magnetic field is removed.

Career Highlights

Jun Zou is affiliated with the University of Illinois, where he continues to advance research in his field. His work has garnered attention for its practical applications in microscopy and electronics.

Collaborations

Jun Zou has collaborated with notable colleagues, including Chang Po Liu and Xuefeng Wang. Their combined expertise contributes to the innovative research environment at the University of Illinois.

Conclusion

Jun Zou is a distinguished inventor whose work in scanning probe microscopy has led to significant advancements in the field. His patents reflect a commitment to innovation and practical applications in technology.