Kusatsu, Japan

Jun Mitsudo

This inventor holds 1 USPTO granted patent. Top assignee: Nec Machinery Corporation. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Mitsudo. Retrieved from https://idiyas.com/inventor/jun-mitsudo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Jun Mitsudo: Innovator in Semiconductor Measurement Technology

Introduction

Jun Mitsudo is a notable inventor based in Kusatsu, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the measurement of height-directional positions of bump electrodes. His innovative approach has led to the development of a method that enhances the precision and efficiency of semiconductor device manufacturing.

Latest Patents

Mitsudo holds a patent for a "Method for measuring height of sphere or hemisphere." This method provides a simple and inexpensive apparatus to measure the uniformity of the height-directional positions of spheres or hemispheres, such as bump electrodes in semiconductor devices. The process involves calculating the degree of focus from images captured at two different focusing positions. By comparing these degrees of focus, the method effectively detects the contour lines of the horizontal cross sections of the bump electrodes, allowing for accurate measurement of their height-directional positions.

Career Highlights

Jun Mitsudo is associated with NEC Machinery Corporation, where he applies his expertise in semiconductor technology. His work has been instrumental in advancing measurement techniques that are crucial for the production of high-quality semiconductor devices. Mitsudo's innovative methods have garnered attention in the industry, showcasing his commitment to improving manufacturing processes.

Collaborations

Mitsudo collaborates with Akira Ishii, a talented woman in the field. Together, they work on projects that aim to enhance the efficiency and accuracy of semiconductor manufacturing techniques. Their partnership exemplifies the importance of collaboration in driving innovation.

Conclusion

Jun Mitsudo's contributions to semiconductor measurement technology highlight his role as an influential inventor. His patented method for measuring height-directional positions of bump electrodes represents a significant advancement in the field. Through his work at NEC Machinery Corporation and collaboration with Akira Ishii, Mitsudo continues to push the boundaries of innovation in semiconductor technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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