Location History:
- Richland, WA (US) (2005)
- Kennewick, WA (US) (2007)
Company Filing History:
Years Active: 2005-2007
Title: Innovations of Juan D Valencia
Introduction
Juan D Valencia is an accomplished inventor based in Kennewick, WA (US). He has made significant contributions to the field of acoustic inspection technology. With a total of 2 patents, his work focuses on non-invasive methods for inspecting various materials and fluids.
Latest Patents
Juan's latest patents include "Methods and apparatus for multi-parameter acoustic signature inspection" and "Acoustic inspection device." The first patent describes a multiparameter acoustic signature inspection device and method designed for non-invasive inspection of containers. This innovative device utilizes dual acoustic signatures to discriminate between various fluids and materials for identification purposes. The second patent outlines an ultrasound inspection apparatus specifically adapted to examine containers, whether sealed or unsealed, containing liquid or solid bulk material. The apparatus is configured like a handheld pistol, with a front transducer contact surface positioned against the container's front wall. An ultrasound pulse is transmitted from the apparatus, reflecting off the back wall of the container being investigated. The received echo pulse is converted into a digital waveform, which is then analyzed to ascertain the characteristics of the liquid or other materials, providing identification.
Career Highlights
Juan D Valencia is currently employed at Battelle Memorial Institute, where he continues to develop and refine his innovative technologies. His work has garnered attention for its practical applications in various industries.
Collaborations
Some of his notable coworkers include Aaron A Diaz and James R Skorpik, who contribute to the collaborative environment at Battelle Memorial Institute.
Conclusion
Juan D Valencia's contributions to acoustic inspection technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in material inspection and offer practical solutions for various applications.