Company Filing History:
Years Active: 2004
Title: **Jouni Pyythiä: Innovator in Semiconductor Imaging Technologies**
Introduction
Jouni Pyythiä is a prominent inventor based in Espoo, Finland. He has made significant contributions to the field of imaging technologies, particularly in semiconductor radiation imaging. With one patent to his name, Pyythiä's work showcases the innovative potential of combining advanced technology with practical applications.
Latest Patents
Jouni Pyythiä's most notable patent is for a "Self triggered imaging device for imaging radiation." This semiconductor radiation imaging assembly includes a semiconductor imaging device with at least one image element detector. The innovation is designed to receive a bias necessary for forming detectors. Furthermore, it incorporates bias monitoring means to assess the bias and determine the radiation incident on the image element detector. The invention emphasizes the monitoring of bias across multiple image element detectors, ensuring precise detection of incident radiation.
Career Highlights
Pyythiä is currently associated with Simage Oy, a company dedicated to advancing imaging solutions. His expertise in semiconductor technology and imaging devices has positioned him as a valuable asset within the organization. His dedication to innovative research contributes to the company's success in providing cutting-edge imaging solutions.
Collaborations
Throughout his career, Jouni Pyythiä has collaborated with experts such as Konstantinos E Spartiotis and Stefan Jurthe. These partnerships reflect a commitment to teamwork and the sharing of knowledge, which are vital in advancing technology and expanding the boundaries of innovation.
Conclusion
Jouni Pyythiä stands out as an influential inventor in the field of semiconductor imaging. His single patent exemplifies the potential impact of innovative technologies in improving radiation imaging methods. Through his work at Simage Oy and collaborations with professionals in the industry, Pyythiä continues to contribute significantly to advancements in imaging technologies.