Miller Place, NY, United States of America

Joseph Vaiana


Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 58(Granted Patents)


Company Filing History:


Years Active: 1994-1995

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2 patents (USPTO):Explore Patents

Title: Joseph Vaiana: Innovator in 3-D Vision Systems

Introduction

Joseph Vaiana is a notable inventor based in Miller Place, NY (US). He has made significant contributions to the field of 3-D vision systems, particularly in the measurement of integrated circuit devices. With a total of 2 patents, his work has advanced the efficiency and accuracy of 3-D data acquisition.

Latest Patents

Vaiana's latest patents focus on methods for obtaining three-dimensional data from multiple parts. These methods utilize 3-D vision systems to measure selected features of objects that are semi-constrained in compartmented trays with a uniform geometric arrangement. His innovations are particularly effective for optimizing the 3-D measurement of leads on integrated circuit devices packaged in trays. The process involves using a multi-pocketed tray with pockets arranged in rows and columns. Corresponding sides of the devices are scanned sequentially with at least one three-dimensional sensor. This scanning procedure is repeated for all rows and columns containing the devices from which data is to be obtained. Additionally, the devices can be aligned by applying directional vibration to the tray, ensuring all parts are positioned at the same corner or side of their respective pockets.

Career Highlights

Joseph Vaiana is currently associated with Robotic Vision Systems, Inc., where he continues to innovate in the field of robotic vision. His work has been instrumental in enhancing the capabilities of 3-D measurement systems.

Collaborations

Vaiana has collaborated with notable colleagues, including Howard K Stern and William E Yonescu, contributing to advancements in their shared field of expertise.

Conclusion

Joseph Vaiana's contributions to 3-D vision systems exemplify the impact of innovative thinking in technology. His patents and ongoing work continue to shape the future of integrated circuit measurement.

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