Jorge L Rivera

Title: Innovations of Jorge L Rivera in Semiconductor Testing

Introduction

Jorge L Rivera is an accomplished inventor based in Hopewell Junction, NY (US). He has made significant contributions to the field of semiconductor technology, particularly in the testing of fine pitch multi-chip modules. His innovative approach has led to the development of a unique system that enhances testing capabilities in this specialized area.

Latest Patents

Jorge holds a patent for a "Selective netlist to test fine pitch multi-chip semiconductor." This system is designed to test every signal input and output (I/O) of fine pitch multi-chip semiconductor modules. It utilizes a selective netlist through currently available test equipment. The technology specifically facilitates the testing of modules that employ 1.0 mm ceramic column grid array (CCGA) technology, thereby enhancing system interconnect capabilities.

Career Highlights

Jorge L Rivera is associated with International Business Machines Corporation (IBM), where he has been instrumental in advancing semiconductor testing methodologies. His work has not only improved testing efficiency but has also contributed to the overall reliability of semiconductor modules in various applications.

Collaborations

Throughout his career, Jorge has collaborated with notable colleagues, including John J Ellison and Chon Cheong Lei. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Jorge L Rivera's contributions to semiconductor testing exemplify the impact of innovative thinking in technology. His patent and work at IBM highlight the importance of advancements in testing methodologies for fine pitch multi-chip modules.