Jong Min Yoon

Title: Jong Min Yoon: Innovator in Wafer Measurement and Game Result Display Technologies

Introduction

Jong Min Yoon is a notable inventor based in Incheon, South Korea. He has made significant contributions to the fields of wafer measurement and game result display technologies. With a total of 2 patents, Yoon's work reflects his innovative spirit and technical expertise.

Latest Patents

Yoon's latest patents include an "Apparatus for Measuring Wafer" and a "Method for Outputting Message Using Game Result Information Window." The apparatus for measuring a wafer is designed to include a chuck on a stage, a plate connected to the stage, and a horizontal frame that supports the wafer. It features multiple adsorption portions for wafer handling and a beam irradiator that interacts with a detector to analyze the wafer. The method for outputting a message utilizes a game result display window, where a computer system dynamically determines the size of the display area for additional information based on the game results of a user. This innovative approach enhances user interaction by providing relevant information in real-time.

Career Highlights

Throughout his career, Jong Min Yoon has worked with prominent companies, including Samsung Electronics Co., Ltd. His experience in these organizations has allowed him to develop and refine his inventions, contributing to advancements in technology.

Collaborations

Yoon has collaborated with notable individuals in his field, including Tae-Heung Ahn and Racine Nassau. These partnerships have likely fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Jong Min Yoon's contributions to technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the fields of wafer measurement and gaming technology, showcasing the importance of innovation in today's world.