Company Filing History:
Years Active: 2011
Title: Jong-Kyu Han: Innovator in Wafer Defect Detection
Introduction
Jong-Kyu Han is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of semiconductor technology, particularly in the area of wafer inspection.
Latest Patents
Jong-Kyu Han holds a patent for an "Apparatus and method for detecting defects in wafer using line sensor camera." This innovative apparatus utilizes an optical part that radiates infrared light under an inspection stage. The image obtaining part detects the infrared light transmitted through the wafer, outputting an image signal. A conveying part moves the image obtaining part or the inspection stage, while a controller counts pulse signals to control the photographing process. The defect detection part combines image signals to generate a comprehensive inspection image. He has 1 patent to his name.
Career Highlights
Jong-Kyu Han is currently employed at Hantech Co., Ltd., where he continues to develop cutting-edge technologies in wafer inspection. His work has been instrumental in enhancing the accuracy and efficiency of defect detection in semiconductor manufacturing.
Collaborations
He has collaborated with notable colleagues, including U-Seock Moon and Byoung-Moon Hwang, contributing to advancements in their field.
Conclusion
Jong-Kyu Han's innovative work in wafer defect detection exemplifies the importance of technological advancements in the semiconductor industry. His contributions continue to shape the future of wafer inspection technology.