Jong-Gu Kang

Title: Jong-Gu Kang: Innovator in Chip Test Equipment

Introduction

Jong-Gu Kang is a notable inventor based in Suwon, South Korea. He has made significant contributions to the field of chip testing technology. His innovative approach has led to the development of advanced testing equipment that enhances performance and efficiency.

Latest Patents

Jong-Gu Kang holds a patent for PC and ATE integrated chip test equipment. This invention relates to a test equipment of a chip memory device. A memory pattern test is implemented using a pattern generation substrate in which a processor is designed in an EPLD. This allows for the implementation of a PC test and pattern programming, enabling tests to be evaluated under a PC environment formed of a CPU and chip sets. The equipment performs two processes of a chip device test and automatic test using a generated test pattern. The PC test and automatic test are separated using a high-speed switching device, which ensures a conversion without signal distortion between the signal lines extended from the chip sets and the pattern generation substrate. This innovation enhances test performance while decreasing test time, error ratio, and product costs.

Career Highlights

Jong-Gu Kang is currently employed at Unitest Incorporation, where he continues to develop and refine testing technologies. His work has been instrumental in advancing the capabilities of chip testing equipment.

Collaborations

Jong-Gu Kang collaborates with Jong-Hyun Kim, contributing to the innovative projects at Unitest Incorporation.

Conclusion

Jong-Gu Kang's contributions to chip testing technology exemplify the impact of innovation in the field. His patented equipment not only improves testing efficiency but also reduces costs, showcasing the importance of advancements in technology.