Company Filing History:
Years Active: 2015-2021
Title: Innovations by Jonathan Spier in Sentiment Analysis
Introduction
Jonathan Spier is an accomplished inventor based in Menlo Park, CA. He has made significant contributions to the field of sentiment analysis, with a focus on methods and apparatus that enhance the understanding of sentiments expressed in various statements, particularly those from social media. With a total of 2 patents, his work has garnered attention for its innovative approach to analyzing sentiment.
Latest Patents
Jonathan's latest patents revolve around the analysis of a corpus of statements to determine the sentiment expressed about specific objects. His methods involve identifying object-specific corpuses, which contain statements referring to the same object. For each statement, the polarity and intensity of sentiment are assessed. The net polarity and intensity measures are then utilized to graph the corpus in a two-dimensional space. This graphical representation allows for the comparison of brands, with each brand represented by an object-specific corpus. Notably, the net polarity has been shown to correlate strongly with traditional survey-based techniques, making his innovations particularly valuable for brand analysis.
Career Highlights
Jonathan Spier is currently associated with Netbase Solutions, Inc., where he continues to develop and refine his innovative approaches to sentiment analysis. His work has positioned him as a key figure in the field, contributing to advancements that benefit various industries.
Collaborations
Some of Jonathan's notable coworkers include Lisa Joy Rosner and Jens Erik Tellefsen. Their collaborative efforts have further enhanced the research and development of sentiment analysis technologies.
Conclusion
Jonathan Spier's contributions to sentiment analysis through his innovative patents have significantly impacted the way sentiments are understood and analyzed in various contexts. His work continues to pave the way for advancements in this important field.