Location History:
- Houston, TX (US) (1995 - 1996)
- Hillsboro, OR (US) (1998)
Company Filing History:
Years Active: 1995-1998
Title: Innovations by Jonathan R Didner
Introduction
Jonathan R Didner is an accomplished inventor based in Houston, TX (US). He has made significant contributions to the field of disk drive technology, holding a total of 4 patents. His work focuses on predicting disk drive failures, which is crucial for maintaining data integrity and system reliability.
Latest Patents
One of Didner's latest patents is titled "Drive failure prediction techniques for disk drives." This invention outlines a method for predicting imminent failures of disk drives by monitoring various attributes during operation. These attributes include self-preserving, performance, error rate, and event count attributes. The method involves determining initial values for each attribute, selecting threshold values, and continuously monitoring the disk drive. If the normalized updated value of any attribute exceeds its threshold, an imminent failure is predicted.
Another notable patent is "Method for performing disk fault prediction operations." This invention describes a layered block device driver that facilitates access to a storage device in a computer system. The driver includes multiple components that work together to manage communication between the application and the storage device, enhancing the efficiency of disk fault prediction.
Career Highlights
Jonathan R Didner is currently employed at Compaq Computer Corporation, Inc., where he continues to innovate in the field of computer technology. His expertise in disk drive systems has positioned him as a key player in developing solutions that enhance data storage reliability.
Collaborations
Didner has collaborated with notable colleagues such as Scott C Farrand and Daniel J Mazina. Their combined efforts have contributed to advancements in disk drive technology and fault prediction methodologies.
Conclusion
Jonathan R Didner's innovative work in disk drive technology has led to significant advancements in predicting failures and enhancing data integrity. His contributions are vital for the ongoing development of reliable storage solutions.